---
title: "Success Story: Reducing Radar Component Test Time by 75% and Improving Vehicle Passenger Safety • Generis"
description: Averna's solution has reduced UUT testing and loading time by 75% while boosting throughput and ensuring stringent quality standards.
image: https://blog.generisgp.com/hubfs/istockphoto-508009966-170667a.webp
---

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# Success Story: Reducing Radar Component Test Time by 75% and Improving Vehicle Passenger Safety

- November 2, 2016

[Generis](https://blog.generisgp.com/blog/author/generis)

*Recently, [Averna](https://www.averna.com/en/home/) was faced with a tough challenge. *

[Autoliv Inc.](https://www.autoliv.com/) needed an automated tester for a Short Range Radar Digital Signal Processing Board used in passenger vehicles. The tester needed to perform 2 batch process model executions in parallel, controlling 12 UUTs simultaneously in high‑volume production.

[![capture555](https://blog.generisgp.com/hs-fs/hubfs/Imported_Blog_Media/capture555.png?width=813&height=172&name=capture555.png)](https://www.autoliv.com/)

Now, fortunately, this is a consumer success story, and Averna was able to use NI TestStand and NI PXI products to develop a tester with a shared hardware architecture that allows the customer to exploit the full potential of its test instruments.

Averna’s solution has reduced UUT testing and loading time by 75% while boosting throughput and ensuring stringent quality standards.

Find out more about how Averna was able to reduce test times and simplify the operator experience by downloading the success story [here](https://insight.averna.com/automotive-radar-solution-reduces-test-time-success-story-averna).

[![capture3](https://blog.generisgp.com/hs-fs/hubfs/Imported_Blog_Media/capture3-1.png?width=582&height=588&name=capture3-1.png)](https://insight.averna.com/automotive-radar-solution-reduces-test-time-success-story-averna)

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